The impact of long-term memory effects on diode power probes

Gomes, Hugo; Testera, Alejandro R.; Carvalho, Nuno Borges; Barciela, Mónica F.; Remley, Kate A.

http://hdl.handle.net/10400.8/14549

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The impact of long-term memory effects on diode power probes.pdf	This paper presents an analysis of long term-memory effects on power measurements with diode power probes. We show that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements using a diode power probe.	1.47 MB	Adobe PDF	Download

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Authors

Gomes, Hugo

Testera, Alejandro R.

Carvalho, Nuno Borges

Barciela, Mónica F.

Remley, Kate A.

Abstract(s)

This paper presents an analysis of long term-memory effects on power measurements with diode power probes. We show that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements using a diode power probe.

Description

Article number - 5514791; Conference name - 2010 IEEE MTT-S International Microwave Symposium, MTT 2010; Conference date - 23 May 2010 - 28 May 2010; Conference code - 81798
Fonte: https://portalcientifico.uvigo.gal/documentos/5fa083ea299952440aaec634
EISBN - 978-1-4244-6058-8

Keywords

Diode Power Probe Long-term Memory Effects Nonlinear Devices Power Measurement

URI

http://hdl.handle.net/10400.8/14549

Citation

Gomes, H., Testera, A. R., Carvalho, N. B., Barciela, M. F., & Remley, K. A. (2010). The impact of long-term memory effects on diode power probes. IEEE MTT-S International Microwave Symposium Digest, 596-599. https://doi.org/10.1109/MWSYM.2010.5514791.