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Cravo Gomes, Hugo Miguel

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0000-0002-0951-8215

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20101
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  • The impact of long-term memory effects on diode power probes
    Publication . Gomes, Hugo; Testera, Alejandro R.; Carvalho, Nuno Borges; Barciela, Mónica F.; Remley, Kate A.
    This paper presents an analysis of long term-memory effects on power measurements with diode power probes. We show that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements using a diode power probe.
    2010-05Conference paper Open access Show more