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- The impact of long-term memory effects on diode power probesPublication . Gomes, Hugo; Testera, Alejandro R.; Carvalho, Nuno Borges; Barciela, Mónica F.; Remley, Kate A.This paper presents an analysis of long term-memory effects on power measurements with diode power probes. We show that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements using a diode power probe.
- Diode Power Probe Measurements of Wireless SignalsPublication . Cravo Gomes, Hugo Miguel; Testera, Alejandro; Carvalho, Nuno; Fernandez-Barciela, Mónica; Remley, Kate A.In this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We show analytically, by simulations, and with measurements, that commonly used single-tone calibration procedures for diode power probes can provide erroneous values when measuring modulated signals used in many new wireless standards. We show that high values of peak-to-average-power ratio can degrade the calibration results due to the low-frequency response imposed by the power probe's baseband circuit impedance. This effect is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements with a diode power probe circuit. This study provides engineers with guidelines for techniques for correction of diode power probe measurements.