Envelope transient simulation of nonlinear electronic circuits using multi-rate Runge-Kutta algorithms

Oliveira, Jorge dos Santos Freitas de; Araújo, A.

http://hdl.handle.net/10400.8/372

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Authors

Oliveira, Jorge dos Santos Freitas de

Araújo, A.

Abstract(s)

Time-step integration is a popular technique commonly used for the envelope transient simulation of an electronic circuit. However, many kinds of circuits are characterized by widely separated time scales, which lead to significant computational costs when numerically solving its differential systems. Even so, this situation can be exploited in an efficient way using multi-rate methods, which integrate system components with different step sizes. In this paper two multi-rate Runge-Kutta schemes are studied and tested in terms of computational speed and numerical stability. The results for linear stability analysis here obtained are much more coherent with the characteristics of the methods than the ones previously presented in [6].

Keywords

Electronic circuit simulation Transient analysis Multi-rate Runge-Kutta methods Speed Stability

URI

http://hdl.handle.net/10400.8/372

Citation

J. Oliveira, A. Araújo, “Envelope transient simulation of nonlinear electronic circuits using multi-rate Runge-Kutta algorithms”, WSEAS Transactions on Electronics, Volume 3, Issue 2, pp. 77-84, Feb. 2006.