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Assessing shot-peening residual stresses by using the incremental hole-drilling technique and laser interferometry (DSPI)

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dc.contributor.authorNobre, João P.
dc.contributor.authorOliveira, Miguel
dc.contributor.authorAlbertazzi, Armando
dc.contributor.authorViotti, Matias
dc.contributor.authorBatista, António Castanhola
dc.contributor.authorCoelho, Luís Manuel de Jesus
dc.contributor.authorMarques, Maria J.
dc.date.accessioned2015-01-28T15:00:58Z
dc.date.available2015-01-28T15:00:58Z
dc.date.issued2014
dc.date.updated2015-01-23T13:24:06Z
dc.descriptionArtigo em acesso restrito.por
dc.description.abstractThe incremental hole-drilling technique was applied to determine residual stress profiles in shot-peened steel layers. The accuracy of using an enhanced Digital Speckle Pattern Interferometry technique for measuring the strain relaxation arising around the drilled holes and, consequently, the in-depth residual stress distribution induced by shot-peening, was evaluated. The experimental results were systematically compared with those determined using standard electric strain-gauges. The X-ray diffraction technique was chosen as reference due to its high accuracy to determine shot-peening residual stresses.por
dc.identifier.citationNobre, João P.; Oliveira, Miguel; Albertazzi, Armando; Viotti, Matias; Batista, António Castanhola; Coelho, Luís; Marques, Maria J.Assessing Shot-Peening Residual Stresses by Using the Incremental Hole-Drilling Technique and Laser Interferometry (DSPI), Advanced Materials Research, 996, 996, 269-276, 2014.por
dc.identifier.issn1662-8985
dc.identifier.urihttp://hdl.handle.net/10400.8/1284
dc.language.isoengpor
dc.peerreviewedyespor
dc.subjectShot-peeningpor
dc.subjectResidual stressespor
dc.subjectHole-drilling methodpor
dc.subjectLaser interferometrypor
dc.subjectDigital speckle pattern interferometry (DSPI)por
dc.titleAssessing shot-peening residual stresses by using the incremental hole-drilling technique and laser interferometry (DSPI)por
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage276por
oaire.citation.startPage269por
oaire.citation.titleAdvanced Materials Researchpor
person.familyNameCoelho
person.givenNameLuis
person.identifier.ciencia-idBA15-610F-1B08
person.identifier.orcid0000-0001-6903-9649
person.identifier.ridE-4029-2016
person.identifier.scopus-author-id55893665500
rcaap.rightsrestrictedAccesspor
rcaap.typearticlepor
relation.isAuthorOfPublicationd3fafd0d-31f9-4fd1-97f0-3b3b64f684cc
relation.isAuthorOfPublication.latestForDiscoveryd3fafd0d-31f9-4fd1-97f0-3b3b64f684cc

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