Repository logo
 
Loading...
Thumbnail Image
Publication

Time precision comparison of digitally controlled delay elements

Use this identifier to reference this record.
Name:Description:Size:Format: 
Time precision comparison of digitally controlled delay elements.pdfThis paper compares the time precision of different digitally controlled delay cells. Other design metrics as delay, signal integrity, power and area are also considered. The precision is evaluated by the cell's uncertainty, given as the ratio between jitter and time delay, considering both thermal and power supply noise. The comparison is based on circuit simulation, in a 180nm technology, using the SPECTRE tool from Cadence. The comparison results will help the designer to choose the most appropriate delay cell for low uncertainty design.1.06 MBAdobe PDF Download

Authors

Figueiredo, Mónica

Advisor(s)

Abstract(s)

This paper compares the time precision of different digitally controlled delay cells. Other design metrics as delay, signal integrity, power and area are also considered. The precision is evaluated by the cell's uncertainty, given as the ratio between jitter and time delay, considering both thermal and power supply noise. The comparison is based on circuit simulation, in a 180nm technology, using the SPECTRE tool from Cadence. The comparison results will help the designer to choose the most appropriate delay cell for low uncertainty design.

Description

Article number 51183702009 IEEE International Symposium on Circuits and Systems, ISCAS 2009, 24 May 2009 through 27 May 2009 - Code 77530

Keywords

Digital control Delay effects Jitter Uncertainty 1f noise Low-frequency noise Voltage Clocks Circuit noise Telecommunication control

Citation

M. Figueiredo and R. L. Aguiar, "Time precision comparison of digitally controlled delay elements," 2009 IEEE International Symposium on Circuits and Systems, Taipei, Taiwan, 2009, pp. 2745-2748, doi: https://doi.org/10.1109/ISCAS.2009.5118370.

Research Projects

Organizational Units

Journal Issue

Publisher

IEEE Canada

CC License

Without CC licence

Altmetrics