Publicação
Diode Power Probe Measurements of Wireless Signals
| dc.contributor.author | Cravo Gomes, Hugo Miguel | |
| dc.contributor.author | Testera, Alejandro | |
| dc.contributor.author | Carvalho, Nuno | |
| dc.contributor.author | Fernandez-Barciela, Mónica | |
| dc.contributor.author | Remley, Kate A. | |
| dc.date.accessioned | 2025-12-16T14:05:44Z | |
| dc.date.available | 2025-12-16T14:05:44Z | |
| dc.date.issued | 2011-04 | |
| dc.description.abstract | In this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We show analytically, by simulations, and with measurements, that commonly used single-tone calibration procedures for diode power probes can provide erroneous values when measuring modulated signals used in many new wireless standards. We show that high values of peak-to-average-power ratio can degrade the calibration results due to the low-frequency response imposed by the power probe's baseband circuit impedance. This effect is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements with a diode power probe circuit. This study provides engineers with guidelines for techniques for correction of diode power probe measurements. | eng |
| dc.description.sponsorship | This work was partially supported by projects TEC2008-06874-C03-02-FEDER, INCITE08PXIB322241PR, Acción Integrada (HP2006-120) and TACCS –PTDC/EEA-TEL/099646/2008. Partial work of the U.S. government, not subject to copyright in the United States. | |
| dc.identifier.citation | H. Gomes, A. Testera, N. Carvalho, M. Fernandez-Barciela and K. A. Remley, "Diode Power Probe Measurements of Wireless Signals," in IEEE Transactions on Microwave Theory and Techniques, vol. 59, no. 4, pp. 987-997, April 2011, doi: 10.1109/TMTT.2010.2100405. | |
| dc.identifier.doi | 10.1109/tmtt.2010.2100405 | |
| dc.identifier.issn | 0018-9480 | |
| dc.identifier.issn | 1557-9670 | |
| dc.identifier.uri | http://hdl.handle.net/10400.8/15080 | |
| dc.language.iso | eng | |
| dc.peerreviewed | yes | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
| dc.relation.hasversion | https://ieeexplore.ieee.org/abstract/document/5696790 | |
| dc.relation.ispartof | IEEE Transactions on Microwave Theory and Techniques | |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.subject | Diode Power Probe | |
| dc.subject | Long-term Memory Effects | |
| dc.subject | Nonlinear Devices | |
| dc.subject | Power Measurement | |
| dc.subject | PAPR. | |
| dc.title | Diode Power Probe Measurements of Wireless Signals | eng |
| dc.type | journal article | |
| dspace.entity.type | Publication | |
| oaire.citation.endPage | 997 | |
| oaire.citation.issue | 4 | |
| oaire.citation.startPage | 987 | |
| oaire.citation.title | IEEE Transactions on Microwave Theory and Techniques | |
| oaire.citation.volume | 59 | |
| oaire.version | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |
| person.familyName | Cravo Gomes | |
| person.givenName | Hugo Miguel | |
| person.identifier.orcid | 0000-0002-0951-8215 | |
| relation.isAuthorOfPublication | 03cf1f34-9674-4280-a221-d87f6e59f75c | |
| relation.isAuthorOfPublication.latestForDiscovery | 03cf1f34-9674-4280-a221-d87f6e59f75c |