Silva, Daniel P. daLamolinara, BarbaraCosta, AndréGameiro, FábioPascoal-Faria, PaulaMateus, ArturMartinez, Juan CarlosPhinyocheep, PraneeAmornsakchai, TaweechaiMitchell, Geoffrey R.2023-04-132023-04-132022Silva, D.P.d.; Lamolinara, B.; Costa, A.; Gameiro, F.; Pascoal-Faria, P.; Mateus,A.;Martinez, J.C.; Phinyocheep, P.; Amornsakchai, T.; Mitchell, G.R. Measuring In-Situ X-ray Scattering of Natural Rubber Biaxial Deformation: A New Equipment for Polymer Studies. Mater. Proc. 2022, 8, 136. https://doi.org/10.3390/ materproc20220081362673-4605http://hdl.handle.net/10400.8/8371This research is supported by national funds through the FCT (Portuguese Foundation for Science and Technology)/MCTES (PIDDAC) under the projects UIDB/04044/2020, UIDP/04044/2020, Associate Laboratory ARISE LA/P/0112/2020 and PAMI—ROTEIRO/0328/2013 (Nº 022158) and UID/Multi/04044/2013.Understanding biaxial deformation is essential for a more realistic evaluation of rubber elasticity compared to the more usual uniaxial deformation. To study crystallisation occurring during biaxial deformation of natural rubber films, a new simple equipment has been designed and assembled. The equipment, mounted in the beamline of ALBA synchrotron light source facility, allowed the in-situ measurement of X-ray scattering of natural rubber during biaxial deformation. This work provides, for the first time, quantitative information on crystallisation during biaxial extension.engNatural rubberBiaxial deformationUUniaxial deformationCrystallisationSAXSWAXSjournal article10.3390/ materproc2022008136