Neves, P. N. B.Barata, J. A. S.Távora, L. M. N.Dias, T. H. V. T.Borges, F. I. G. M.Conde, C. A. N.2025-11-282025-11-282010-10P. N. B. Neves, J. A. S. Barata, L. M. N. Távora, T. H. V. T. Dias, F. I. G. M. Borges and C. A. N. Conde, "Photopeak shift effects due to the drift electric field in high pressure xenon detectors," IEEE Nuclear Science Symposium & Medical Imaging Conference, Knoxville, TN, USA, 2010, pp. 1472-1473, doi: https://doi.org/10.1109/NSSMIC.2010.5874017.978-1-4244-9106-3978-1-4244-9105-61082-3654http://hdl.handle.net/10400.8/14793Article number - 5874017; Conference name - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010; Conference date - 30 October 2010 - 6 November 2010; Conference code - 85520EISBN - 978-1-4244-9105-6The photopeak shift in High Pressure Xe (HPXe) gamma ray detectors due to the energy acquired/lost by the photoelectric and Compton electrons, from the electric field applied in the drift region, is calculated using the PENELOPE code for gamma rays from several radioactive sources. The implications of this effect in HPXe detectors are discussed, namely for TPCs for double beta decay of 136 Xe studies.engElectric fieldsPhotonicsXenonDetectorsPhysicsRadiation detectorsMonte Carlo methodsconference paper10.1109/nssmic.2010.5874017